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SN54LVTH182512 - 3.3-V ABT SCAN TEST DEVICES

Download the SN54LVTH182512 datasheet PDF (SN54LVTH18512 included). The manufacturer datasheet provides complete specifications, pinout details, electrical characteristics, and typical applications for 3.3-v abt scan test devices.

Description

The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.

This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

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Note: The manufacturer provides a single datasheet file (SN54LVTH18512-etcTI.pdf) that lists specifications for multiple related part numbers.

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Full PDF Text Transcription

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SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS671B – AUGUST 1996 – REVISED OCTOBER 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.
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