SN74AUP1G17-EP Datasheet | Texas Instruments

.ti. SN74AUP1G17-EP LOW-POWER SINGLE SCHMITT-TRIGGER BUFFER SCES684 - JANUARY 2007 Features - Controlled Baseline - One Assembly/Test Site, One Fabrication Site - Enhanced Diminishing Manufacturing Sources (DMS) Support - Enhanced Product-Change Notification - Qualification Pedigree (1) - Available in the Texas Instruments Nano Star™ and Nano Free™ Packages - Low Static-Power Consumption (ICC = 0.9 µA Max) - Low Dynamic-Power Consumption (Cpd = 4.4 p F Typ at 3.3 V) - Low Input Capacitance (CI = 1.5 p F) - Low Noise - Overshoot and Undershoot <10% of VCC - Ioff Supports Partial-Power-Down Mode Operation - Includes Schmitt-Trigger Inputs - Wide Operating VCC Range of 0.8 V to 3.6 V - Optimized for 3.3-V Operation - 3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation (1) ponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold pound life. Such qualification testing should not be viewed as justifying use of this ponent beyond specified performance and environmental limits. - tpd = 5.1 ns Max at 3.3 V - Suitable for Point-to-Point Applications - Latch-Up Performance Exceeds 100 m A Per JESD 78, Class II - ESD Performance Tested Per JESD 22 - 2000-V Human-Body Model (A114-B, Class...