TPS7H3301-SP Datasheet | Texas Instruments

Features - 1 5962R14228(1): - Radiation hardness assurance (RHA) qualified to total ionizing dose (TID) 100 krad(Si) - Single event latch-up (SEL), single event gate rupture (SEGR), single event burnout (SEB) immune to LET = 70 Me V-cm2/mg(2) - Single event transient (SET), single event functional interrupt (SEFI), and single event upset (SEU) characterized to 70 Me Vcm2/mg(2) - Supports DDR, DDR2, DDR3, DDR3L, and DDR4 termination applications - Input voltage: supports a 2.5-V and 3.3-V rail(3) - Separate low-voltage input (VLDOIN) down to 0.9 V for improved power efficiency(3) - 3-A sink and source termination regulator includes droop pensation - Enable input and power-good output for power supply sequencing - VTT termination regulator - Output voltage range: 0.5 to 1.75 V - 3-A sink and source current - Integrated precision voltage divider network with sense input - Remote sensing (VTTSNS) - VTTREF buffered reference - ±15-m V accuracy - ±10-m A sink and source current - Undervoltage lockout (UVLO) and overcurrent limit (OCL) functionality integrated 2 Applications - mand and data handling (C&DH) - Optical imaging payload - Radar imaging payload 3 Description The TPS7H3301-SP is a TID and SEE radiationhardened double data rate (DDR) 3-A termination regulator with built-in VTTREF buffer. The regulator is specifically designed to provide a plete, pact, low-noise solution for space DDR termination applications such as single board puters, solid state recorders, and payload processing. The TPS7H3301-SP supports DDR VTT termination applications using DDR, DDR2, DDR3, DDR4. The fast transient response of the TPS7H3301-SP VTT regulator allows for a very stable supply during read/write conditions. During transients, the fast tracking feature of the VTTREF supply minimizes any voltage offset between VTT/Vo and VTTREF. To enable simple power sequencing, both an enable input and a power-good output (PGOOD) have been integrated into the TPS7H3301-SP. The PGOOD output is...