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89C51ED2 - AT89C51ED2

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Datasheet Details

Part number
89C51ED2
Manufacturer
ATMEL Corporation
File Size
1.38 MB
Datasheet
89C51ED2_ATMELCorporation.pdf
Description
AT89C51ED2

89C51ED2 Product details

Description

Electrical Life Test (Early Failure Rate) 48 hours 140°C Electrical Life Test (Latent Failure Rate) 1000 hours 140°C Dynamic or Static Electrostatic Discharge HBM +/-2000v 1.5kOhm/100pF/3 pulses Latch up 50mW power injection, 50% overvoltage @125°C NVM Endurance Program Erase Cycles 25°C NVM Data Retention High Temperature Storage 165°C Temperature Cycling 1000 cycles. 65°C/150°C air/air HAST after Preconditioning 144 hours 130°C/85%RH 85/85 Humidity Test 1000 hours 85°C/85%RH HAST 336 h.

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AT89C51ED2 ATMEL Corporation
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