Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Drain--Source Voltage
Gate--Source Voltage
Operating Voltage
Storage Temperature Range
Case Operating Temperature Range
Operating Junction Temperature Range (1,2)
Total Device Dissipation @ TC = 25C
Derate above 25C
VDSS
VGS
VDD
Tstg
TC
TJ
PD
–0.5, +105
–6.0, +10
55, +0
– 65 to +150
–55 to +150
–55 to +225
526
2.63
Vdc
Vdc
Vdc
C
C
C
W
W/C
Table 2. Thermal Characteristics
Characteristic
Symbol
Value (2,3)
Unit
Thermal Impedance, Junction to Case
Pulse: Case Temperature 75C, 730 W Peak, 128 sec Pulse Width,
10% Duty Cycle, 50 Vdc, IDQ(A+B) = 100 mA, 1030 MHz
Table 3. ESD Protection Characteristics
ZJC
0.030
C/W
Test Methodology
Class
Human Body Model (per JESD22--A114)
2, passes 2000 V
Charge Device Model (per JESD22--C101)
C3, passes 2000 V
Table 4. Electrical Characteristics (TA = 25C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max Unit
Off Characteristics (4)
Gate--Source Leakage Current
(VGS = 5 Vdc, VDS = 0 Vdc)
Drain--Source Breakdown Voltage
(VGS = 0 Vdc, ID = 10 A)
Zero Gate Voltage Drain Leakage Current
(VDS = 50 Vdc, VGS = 0 Vdc)
Zero Gate Voltage Drain Leakage Current
(VDS = 105 Vdc, VGS = 0 Vdc)
IGSS
V(BR)DSS
IDSS
IDSS
—
105
—
—
—
—
—
—
1 Adc
— Vdc
1 Adc
10 Adc
On Characteristics
Gate Threshold Voltage (4)
(VDS = 10 Vdc, ID = 260 Adc)
VGS(th)
1.3
1.8
2.3 Vdc
Gate Quiescent Voltage
VGS(Q)
1.6
2.1
2.6 Vdc
(VDD = 50 Vdc, IDQ(A+B) = 100 mAdc, Measured in Functional Test)
Drain--Source On--Voltage (4)
(VGS = 10 Vdc, ID = 2.6 Adc)
VDS(on)
—
0.28
—
Vdc
Dynamic Characteristics (4,5)
Reverse Transfer Capacitance
(VDS = 50 Vdc 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Crss — 1.16 — pF
1. Continuous use at maximum temperature will affect MTTF.
2. MTTF calculator available at http://www.nxp.com.
3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.nxp.com/RF and search for AN1955.
4. Each side of device measured separately.
5. Part internally matched both on input and output.
(continued)
AFV10700H AFV10700HS AFV10700GS
2
RF Device Data
NXP Semiconductors