D Low Output Skew, Low Pulse Skew for
Clock-Distribution and Clock-Generation
D Operates at 3.3-V VCC
D LVTTL-Compatible Inputs and Outputs
D Supports Mixed-Mode Signal Operation
(5-V Input and Output Voltages With 3.3-V
D Distributes One Clock Input to Ten Outputs
D Outputs Have Internal Series Damping
Resistor to Reduce Transmission Line
D Distributed VCC and Ground Pins Reduce
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D Package Options Include Plastic
Small-Outline (DW) and Shrink
Small-Outline (DB) Packages
D Available in Q-Temp Automotive
High Reliability Automotive Applications
Configuration Control / Print Support
Qualification to Automotive Standards
1-LINE TO 10-LINE CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS442D – FEBRUARY 1994 – REVISED SEPTEMBER 2000
DB OR DW PACKAGE
The CDC2351 is a high-performance clock-driver circuit that distributes one input (A) to ten outputs (Y) with
minimum skew for clock distribution. The output-enable (OE) input disables the outputs to a high-impedance
state. Each output has an internal series damping resistor to improve signal integrity at the load. The CDC2351
operates at nominal 3.3-V VCC.
The propagation delays are adjusted at the factory using the P0 and P1 pins. The factory adjustments ensure
that the part-to-part skew is minimized and is kept within a specified window. Pins P0 and P1 are not intended
for customer use and should be connected to GND.
The CDC2351 is characterized for operation from 0°C to 70°C. The CDC2351Q is characterized for operation
over the full automotive temperature range of – 40°C to 125°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC-ΙΙΒ is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 2000, Texas Instruments Incorporated
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