Datasheet Summary
- Members of the Texas Instruments
SCOPE ™ Family of Testability Products
- Members of the Texas Instruments
Widebus ™ Family
- patible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
- UBT ™ (Universal Bus Transceiver) bines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
- Two Boundary-Scan Cells per I/O for
Greater Flexibility
- State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design
Significantly Reduces Power Dissipation
SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS108B
- AUGUST 1992
- REVISED JUNE 1993
- SCOPE ™ Instruction Set
- IEEE Standard 1149.1-1990 Required...