SN54ABT8543 Datasheet | Texas Instruments

SN54ABT8543, SN74ABT8543 SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS SCBS120E - AUGUST 1991 - REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D patible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F543 and ’ABT543 in the Normal-Function Mode D SCOPE ™ Instruction Set - IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ - Parallel-Signature Analysis at Inputs With Masking Option - Pseudo-Random Pattern Generation From Outputs - Sample Inputs/Toggle Outputs - Binary Count From Outputs - Even-Parity Opcodes D Two Boundary-Scan...