IRH7450SE Datasheet - International Rectifier

IRH7450SE TRANSISTOR N-CHANNEL

www.DataSheet4U.com Previous Datasheet Index Next Data Sheet Provisional Data Sheet No. PD 9.1390 REPETITIVE AVALANCHE AND dv/dt RATED IRH7450SE N-CHANNEL HEXFET® TRANSISTOR 500 Volt, 0.51Ω , (SEE) RAD HARD HEXFET International Rectifier’s (SEE) RAD HARD technology HEXFETs demonstrate virtual immunity to SEE failure. Additionally, under identical pre- and post-radiation test conditions, International Rectifier’s RAD HARD HEXFETs retain identical electrical specifications up to 1 x 105 Rads.

IRH7450SE Features

* n n n n n n n n n n n Radiation Hardened up to 1 x 10 5 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditions Repetitive Avalanche Rating Dynamic dv/dt Rating Simp

IRH7450SE Datasheet (126.32 KB)