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ACS03MS - Radiation Hardened Quad 2-Input NAND Gate

Datasheet Summary

Features

  • Pinouts.
  • Devices QML Qualified in Accordance with MIL-PRF-38535.
  • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96703 and Intersil’s QM Plan.
  • 1.25 Micron Radiation Hardened SOS CMOS.
  • Total Dose.
  • . . >300K RAD (Si).
  • Single Event Upset (SEU) Immunity: 100 MEV-cm2/mg.

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Datasheet Details

Part number ACS03MS
Manufacturer Intersil Corporation
File Size 82.19 KB
Description Radiation Hardened Quad 2-Input NAND Gate
Datasheet download datasheet ACS03MS Datasheet
Additional preview pages of the ACS03MS datasheet.

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Full PDF Text Transcription

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ACS03MS January 1996 Radiation Hardened Quad 2-Input NAND Gate with Open Drain Features Pinouts • Devices QML Qualified in Accordance with MIL-PRF-38535 • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96703 and Intersil’s QM Plan • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300K RAD (Si) • Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day (Typ) • SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 MEV-cm2/mg • Dose Rate Upset . . . . . . . . . . . . . . . . >1011 RAD (Si)/s, 20ns Pulse • Dose Rate Survivability . . . . . . . . . . . >1012 RAD (Si)/s, 20ns Pulse • Latch-Up Free Under Any Conditions • Military Temperature Range . . . . . . . . . . . . . . . .
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