IS-2100ARH Datasheet - Intersil Corporation

IS-2100ARH Radiation Hardened High Frequency Half Bridge Driver

IS-2100ARH, IS-2100AEH Radiation Hardened High Frequency Half Bridge Drivers Datasheet The radiation hardened IS-2100ARH, IS-2100AEH are high frequency, 130V half bridge N-Channel MOSFET driver ICs, which are functionally similar to industry standard 2110 types. The low-side and highside gate drivers are independently controlled. This gives the user maximum flexibility in dead time selection and driver protocol. In addition, the devices have on-chip error detection and correction circuitry, wh.

IS-2100ARH Features

* ▪ Electrically screened to DLA SMD # 5962-99536 ▪ QML qualified per MIL-PRF-38535 requirements ▪ Radiation environment

* TID Rad Hard Assurance (RHA) testing ◦ HDR (50-300rad(Si)/s): 300krad(Si) ◦ LDR (≤ 10mrad(Si)/s): 50krad(Si) (AEH Only)

* DI RSG process provides latch-up immunity

IS-2100ARH_IntersilCorporation.pdf