DS21Q58 Datasheet - Maxim Integrated Products

DS21Q58 Dallas Semiconductor

A description of this device can be found in the product data sheet. You can find the product data sheet at http://dbserv.maxim-ic.com/l_datasheet3.cfm. Reliability Derating: The Arrhenius model will be used to determine the acceleration factor for failure mechanisms that are temperature accelerate.

06/01/04 RELIABILITY REPORT FOR DS21Q58, Rev B1 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Staff Reliability Engineer Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : don.lipps@dalsemi.com ph: 972-371-3739 fax: 972-371-6016 Conclusion: The following qualification successfully meets the quality and reliability standards required of all Dallas Semiconductor products and processes: DS21Q58, Rev B1 In addition, Dall.

DS21Q58 Datasheet (17.45 KB)