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DS21Q59 Datasheet - Maxim Integrated Products

DS21Q59 RELIABILITY REPORT FOR DS21Q59/ REV A2

A description of this device can be found in the product data sheet. You can find the product data sheet at http://dbserv.maxim-ic.com/l_datasheet3.cfm. Reliability Derating: The Arrhenius model will be used to determine the acceleration factor for failure mechanisms that are temperature accelerate.
02/03/2004 RELIABILITY REPORT FOR DS21Q59, Rev A2 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com ph: 972-371-3726 fax: 972-371-6016 mbl: 214-435-6610 Conclusion: The following qualification successfully meets the quality and reliability standards required of all Dallas Semiconductor products and processes: DS21Q.

DS21Q59 Datasheet (17.14 KB)

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Datasheet Details

Part number:

DS21Q59

Manufacturer:

Maxim Integrated ↗ Products

File Size:

17.14 KB

Description:

Reliability report for ds21q59/ rev a2.

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DS21Q59 RELIABILITY REPORT FOR DS21Q59 REV Maxim Integrated Products

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