D17133CS Datasheet - NEC

D17133CS UPD17133CS

. When using the µPD17120, 17132, and 17P132, please change the readings to OSC1, OSC0 and fCC. www.DataSheet4U.com TABLE OF CONTENTS CHAPTER 1 GENERAL 1.1 1.2 1.3 1.4 FUNCTION LIST ORDERING INFORMATION BLOCK DIAGRAM PIN CONFIGURATION (Top View) 1 2 3 4 6 9 9 9 11 CHAPTER 2 PIN FUNCTIONS .

www.DataSheet4U.com µPD17120 SUBSERIES 4-BIT SINGLE-CHIP MICROCONTROLLER µPD17120 µPD17121 µPD17132 µPD17133 µPD17P132 µPD17P133 © 1993 Document No. IEU-1367A (O. D. No. IEU-835A) Date Published July 1995 P Printed in Japan www.DataSheet4U.com NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation.

D17133CS Features

* NEC devices are classified into the following three quality grades: “Standard“, “Special“, and “Specific“. The Specific quality grade applies only to devices developed based on a customer designated “quality assurance program“ for a specific application. The recommended applications of a device dep

D17133CS_NEC.pdf