SN54LVT18502 Datasheet - Texas Instruments

SN54LVT18502 3.3-V ABT SCAN TEST DEVICE

The SN54LVT18502 scan test device with 18-bit universal bus transceivers is a member of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access .

SN54LVT18502 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS669 JULY 1996 D Member of the Texas Instruments SCOPE ™ Family of Testability Products D Member of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Supports Unregulated Battery Operation Down to 2.7 V D UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operati.

SN54LVT18502 Datasheet (479.77 KB)