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SN54LVT18512 3.3-V ABT SCAN TEST DEVICES

SN54LVT18512 Description

SN54LVT18512, SN54LVT182512, SN74LVT18512, SN74LVT182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS711 * OCTOBER .
The ’LVT18512 and ’LVT182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integr.

SN54LVT18512 Applications

* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Widebus, and UBT are trademarks of Texas Instruments Incorporated. UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products con

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3.3-V ABT SCAN TEST DEVICES Texas Instruments
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