SN74BCT8245A Datasheet (Texas Instruments)

SN74BCT8245A, SCAN TESTER

The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE™ testability integratedcircuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

Scan access to the test cir

SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E MAY 1990 REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Octal Test-Integrated Circuits D Functionally Equivalent to ’F245 and ’BCT245 in the Normal- Function Mode D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchronous to Test Access Port (TAP) D Implement Optional Test Res