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SN74LVTH182512 Datasheet - Texas Instruments

SN74LVTH182512 3.3-V ABT SCAN TEST DEVICES

The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Sc.
SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS671B AUGUST 1996 REVISED OCTOBER 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.7 V D UBT ™ (.

SN74LVTH182512 Datasheet (683.44 KB)

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Datasheet Details

Part number:

SN74LVTH182512

Manufacturer:

Texas Instruments ↗

File Size:

683.44 KB

Description:

3.3-v abt scan test devices.

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