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SN74LVTH182512, SN74LVTH18512 - 3.3-V ABT SCAN TEST DEVICES

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This datasheet PDF includes multiple part numbers: SN74LVTH182512, SN74LVTH18512. Please refer to the document for exact specifications by model.
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Datasheet Details

Part number SN74LVTH182512, SN74LVTH18512
Manufacturer Texas Instruments
File Size 683.44 KB
Description 3.3-V ABT SCAN TEST DEVICES
Datasheet download datasheet SN74LVTH18512-etcTI.pdf
Note This datasheet PDF includes multiple part numbers: SN74LVTH182512, SN74LVTH18512.
Please refer to the document for exact specifications by model.

SN74LVTH182512 Product details

Description

The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.

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