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SN74LVTH182512, SN74LVTH18512 3.3-V ABT SCAN TEST DEVICES

SN74LVTH182512 Description

SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS671B * AUG.
The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integ.

SN74LVTH182512 Applications

* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Widebus, and UBT are trademarks of Texas Instruments Incorporated. UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products con

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This datasheet PDF includes multiple part numbers: SN74LVTH182512, SN74LVTH18512. Please refer to the document for exact specifications by model.
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Datasheet Details

Part number
SN74LVTH182512, SN74LVTH18512
Manufacturer
Texas Instruments ↗
File Size
683.44 KB
Datasheet
SN74LVTH18512-etcTI.pdf
Description
3.3-V ABT SCAN TEST DEVICES
Note
This datasheet PDF includes multiple part numbers: SN74LVTH182512, SN74LVTH18512.
Please refer to the document for exact specifications by model.

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3.3-V ABT SCAN TEST DEVICES Texas Instruments
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