Datasheet4U Logo Datasheet4U.com

SN74LVTH18502A 3.3-V ABT SCAN TEST DEVICES

SN74LVTH18502A Description

SN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS668C *.
The ’LVTH18502A and ’LVTH182502A scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE™ testability inte.

SN74LVTH18502A Applications

* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Widebus, and UBT are trademarks of Texas Instruments. UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to speci

📥 Download Datasheet

Preview of SN74LVTH18502A PDF
datasheet Preview Page 2 datasheet Preview Page 3

📁 Related Datasheet

  • SN74LVC1G125 - high performance non-inverting buffer (UMW)
  • SN74LVC1G34 - Single buffer (UMW)
  • SN74L71 - AND-Gate R-S Master-Slave F-F (National Semiconductor)
  • SN74L74N - Dual D-Type Flip-Flop (ETC)
  • SN74LS00 - QUAD 2-INPUT NAND GATE (Motorola)
  • SN74LS02 - QUAD 2-INPUT NOR GATE (Motorola)
  • SN74LS04 - Hex Inverter (ON Semiconductor)
  • SN74LS04D - Hex Inverter (ON Semiconductor)

📌 All Tags

3.3-V ABT SCAN TEST DEVICES Texas Instruments
Texas Instruments SN74LVTH18502A-like datasheet