SN74LVTH18512 - 3.3-V ABT SCAN TEST DEVICES

Name: SN74LVTH18512
SKU: SN74LVTH18512-1566899

Texas Instruments

📥 Download Datasheet

SN74LVTH18512 Datasheet Preview — Preview of SN74LVTH18512 PDF

Datasheet Details

Part number	SN74LVTH18512
Manufacturer	Texas Instruments
File Size	683.44 KB
Description	3.3-V ABT SCAN TEST DEVICES
Datasheet	SN74LVTH18512-etcTI.pdf

SN74LVTH18512 Product details

Description

The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.

📁 SN74LVTH18512 Similar Datasheet

SN74LVC1G125 - high performance non-inverting buffer (UMW)
SN74LVC1G34 - Single buffer (UMW)
SN74L71 - AND-Gate R-S Master-Slave F-F (National Semiconductor)
SN74L74N - Dual D-Type Flip-Flop (ETC)
SN74LS00 - QUAD 2-INPUT NAND GATE (Motorola)
SN74LS02 - QUAD 2-INPUT NOR GATE (Motorola)
SN74LS04 - Hex Inverter (ON Semiconductor)
SN74LS04D - Hex Inverter (ON Semiconductor)

Other Datasheets by Texas Instruments

SN74LVTH18502A - 3.3-V ABT SCAN TEST DEVICES
SN74LVTH18504A - 3.3-V ABT SCAN TEST DEVICES
SN74LVTH182502A - 3.3-V ABT SCAN TEST DEVICES
SN74LVTH182504A - 3.3-V ABT SCAN TEST DEVICES
SN74LVTH182512 - 3.3-V ABT SCAN TEST DEVICES
SN74LVTH182646A - 3.3-V ABT SCAN TEST DEVICES

Published: Feb 6, 2025 |