Datasheet Details
Part number:
SN74LVTH182646A, SN74LVTH18646A
Manufacturer:
File Size:
885.34 KB
Description:
3.3-v abt scan test devices.
Note:
This datasheet PDF includes multiple part numbers: SN74LVTH182646A, SN74LVTH18646A.
Please refer to the document for exact specifications by model.
SN74LVTH182646A, SN74LVTH18646A, 3.3-V ABT SCAN TEST DEVICES
The ’LVTH18646A and ’LVTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family.
This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assem
SN54LVTH18646A, SN54LVTH182646A, SN74LVTH18646A, SN74LVTH182646A 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS311D MARCH 1994 REVISED JUNE 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.7 V D Include
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