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SN74LVTH182646A, SN74LVTH18646A Datasheet - Texas Instruments

SN74LVTH182646A 3.3-V ABT SCAN TEST DEVICES

The ’LVTH18646A and ’LVTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assem.
SN54LVTH18646A, SN54LVTH182646A, SN74LVTH18646A, SN74LVTH182646A 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS311D MARCH 1994 REVISED JUNE 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.7 V D Include.

SN74LVTH18646A-etcTI.pdf

This datasheet PDF includes multiple part numbers: SN74LVTH182646A, SN74LVTH18646A. Please refer to the document for exact specifications by model.
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Datasheet Details

Part number:

SN74LVTH182646A, SN74LVTH18646A

Manufacturer:

Texas Instruments ↗

File Size:

885.34 KB

Description:

3.3-v abt scan test devices.

Note:

This datasheet PDF includes multiple part numbers: SN74LVTH182646A, SN74LVTH18646A.
Please refer to the document for exact specifications by model.

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SN74LVTH182646A SN74LVTH18646A 3.3-V ABT SCAN TEST DEVICES Texas Instruments

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