Part number:
SN74LVTH18652A
Manufacturer:
File Size:
888.40 KB
Description:
3.3-v abt scan test devices.
Datasheet Details
Part number:
SN74LVTH18652A
Manufacturer:
File Size:
888.40 KB
Description:
3.3-v abt scan test devices.
SN74LVTH18652A, 3.3-V ABT SCAN TEST DEVICES
The ’LVTH18652A and ’LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family.
This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assem
SN54LVTH18652A, SN54LVTH182652A, SN74LVTH18652A, SN74LVTH182652A 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS312C MARCH 1994 REVISED JUNE 1997 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Support Unregulated Battery Operation Down to 2.7 V D Include
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