Datasheet4U Logo Datasheet4U.com

SN74LVTH18652A 3.3-V ABT SCAN TEST DEVICES

SN74LVTH18652A Description

SN54LVTH18652A, SN54LVTH182652A, SN74LVTH18652A, SN74LVTH182652A 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS312C *.
The ’LVTH18652A and ’LVTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testabil.

SN74LVTH18652A Applications

* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE and Widebus are trademarks of Texas Instruments Incorporated. UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform t

📥 Download Datasheet

Preview of SN74LVTH18652A PDF
datasheet Preview Page 2 datasheet Preview Page 3

📁 Related Datasheet

  • SN74LVC1G125 - high performance non-inverting buffer (UMW)
  • SN74LVC1G34 - Single buffer (UMW)
  • SN74L71 - AND-Gate R-S Master-Slave F-F (National Semiconductor)
  • SN74L74N - Dual D-Type Flip-Flop (ETC)
  • SN74LS00 - QUAD 2-INPUT NAND GATE (Motorola)
  • SN74LS02 - QUAD 2-INPUT NOR GATE (Motorola)
  • SN74LS04 - Hex Inverter (ON Semiconductor)
  • SN74LS04D - Hex Inverter (ON Semiconductor)

📌 All Tags

3.3-V ABT SCAN TEST DEVICES Texas Instruments
Texas Instruments SN74LVTH18652A-like datasheet