Datasheet4U Logo Datasheet4U.com

IRHNA8160 - N-CHANNEL TRANSISTOR

This page provides the datasheet information for the IRHNA8160, a member of the IRHNA7160 N-CHANNEL TRANSISTOR family.

Features

  • n n n n n n n n n n n n n Radiation Hardened up to 1 x 10 6 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditions Repetitive Avalanche Rating Dynamic dv/dt Rating Simple Drive Requirements Ease of Paralleling Hermetically Sealed Surface Mount Lightweight Absolute Maximum Ratings Parameter ID @ VGS = 12V, TC = 25°C Continuous Drain Current ID @ VGS = 12V, TC =.

📥 Download Datasheet

Datasheet preview – IRHNA8160

📁 Similar Datasheet

  • IRH-12-12.5-T110 - Encapsulated 150-Watt Isolated DC-DC Converter (muRata)
  • IRH-24-6.3-T110 - Encapsulated 150-Watt Isolated DC-DC Converter (muRata)
  • IRH-5-30-T110 - Encapsulated 150-Watt Isolated DC-DC Converter (muRata)
  • IRH3 - INCREMENTAL HOLLOW-SHAFT ENCODER (HEIDENHAIN)
  • IRH310 - INCREMENTAL HOLLOW-SHAFT ENCODER (HEIDENHAIN)
  • IRH320 - INCREMENTAL HOLLOW-SHAFT ENCODER (HEIDENHAIN)
  • IRH360 - INCREMENTAL HOLLOW-SHAFT ENCODER (HEIDENHAIN)
  • IRHM2C50SE - N-Channel Transistor (IRF)
  • IRHM53260 - (IRHM5x260) RADIATION HARDENED POWER MOSFET THRU-HOLE (IRF)
  • IRHM54260 - (IRHM5x260) RADIATION HARDENED POWER MOSFET THRU-HOLE (IRF)
Other Datasheets by International Rectifier

Full PDF Text Transcription

Click to expand full text
www.DataSheet4U.com Previous Datasheet Index Next Data Sheet Provisional Data Sheet No. PD-9.1396 REPETITIVE AVALANCHE AND dv/dt RATED HEXFET TRANSISTOR ® IRHNA7160 IRHNA8160 N-CHANNEL MEGA RAD HARD 100 Volt, 0.045 Ω, MEGA RAD HARD HEXFET International Rectifier’s RAD HARD technology HEXFETs demonstrate virtual immunity to SEE failure. Additionally, under identical pre- and post-radiation test conditions, International Rectifier’s RAD HARD HEXFETs retain identical electrical specifications up to 1 x 105 Rads (Si) total dose. No compensation in gate drive circuitry is required. These devices are also capable of surviving transient ionization pulses as high as 1 x 1012 Rads (Si)/Sec, and return to normal operation within a few microseconds.
Published: |