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HCTS193MS - Radiation Hardened Synchronous 4-Bit Up/Down Counter

General Description

The Intersil HCTS193MS is a Radiation Hardened 4-bit binary UP/DOWN synchronous counter.

Presetting the counter to the number on the preset data inputs (P0 - P3) is accomplished by a low on the asynchronous parallel load input (PL).

Key Features

  • 3 Micron Radiation Hardened CMOS SOS Total Dose 200K RAD (Si) SEP Effective LET No Upsets: >100 MEV-cm2/mg Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/BitDay (Typ) Dose Rate Survivability: >1 x 1012 RAD (Si)/s Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse Latch-Up Free Under Any Conditions Fanout (Over Temperature Range) - Standard Outputs - 10 LSTTL Loads Military Temper.

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Other Datasheets by Intersil (now Renesas)

Part Number Description
HCTS190MS Radiation Hardened Synchronous 4-Bit Up/Down Counter
HCTS109MS Radiation Hardened Dual JK Flip Flop
HCTS109T Radiation Hardened Dual JK Flip Flop
HCTS10MS Radiation Hardened Triple 3-Input NAND Gate
HCTS112MS Radiation Hardened Dual JK Flip-Flop

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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HCTS193MS September 1995 Radiation Hardened Synchronous 4-Bit Up/Down Counter Pinouts 16 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (SBDIP) MIL-STD-1835 CDIP2-T16 TOP VIEW P1 Q1 Q0 CPD CPU Q2 Q3 GND 1 2 3 4 5 6 7 8 16 VCC 15 P0 14 MR 13 TCD 12 TCU 11 PL 10 P2 9 P3 Features • • • • • • • • • • • • 3 Micron Radiation Hardened CMOS SOS Total Dose 200K RAD (Si) SEP Effective LET No Upsets: >100 MEV-cm2/mg Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/BitDay (Typ) Dose Rate Survivability: >1 x 1012 RAD (Si)/s Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse Latch-Up Free Under Any Conditions Fanout (Over Temperature Range) - Standard Outputs - 10 LSTTL Loads Military Temperature Range: -55oC to +125oC Significant Power Reduction Compared to LSTTL ICs DC Operating Voltage Range: 4.5V to 5.