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HCTS74T - Radiation Hardened Dual-D Flip-Flop with Set and Reset

General Description

only.

Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice.

Accordingly, the reader is cautioned to verify that data sheets are current before placing orders.

Key Features

  • QML Class T, Per MIL-PRF-38535.
  • Radiation Performance - Gamma Dose (γ) 1 x 105 RAD(Si) - Latch-Up Free Under Any Conditions - SEP Effective LET No Upsets: >100 MEV-cm2/mg - Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ).
  • 3 Micron Radiation Hardened SOS CMOS.
  • Significant Power Reduction Compared to LSTTL ICs Specifications Specifications for Rad Hard QML devices are controlled by the Defense Supply Center in Columbus (DSCC). The SMD numbers li.

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Other Datasheets by Intersil (now Renesas)

Part Number Description
HCTS74MS Radiation Hardened Dual-D Flip-Flop
HCTS75MS Radiation Hardened Dual 2-Bit Bistable Transparent Latch
HCTS00MS Radiation Hardened Quad 2-Input NAND Gate
HCTS02MS Radiation Hardened Quad 2-Input NOR Gate
HCTS04MS Radiation Hardened Hex Inverter

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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HCTS74T Data Sheet July 1999 File Number 4625.1 Radiation Hardened Dual-D Flip-Flop with Set and Reset Intersil’s Satellite Applications FlowTM (SAF) devices are fully tested and guaranteed to 100kRAD total dose. These QML Class T devices are processed to a standard flow intended to meet the cost and shorter lead-time needs of large volume satellite manufacturers, while maintaining a high level of reliability. The Intersil HCTS74T is a Radiation Hardened positive edge triggered flip-flop with set and reset.