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SCAN18373T Datasheet Transparent Latch

Manufacturer: National Semiconductor (now Texas Instruments)

Overview: SCAN18373T Transparent Latch with TRI-STATE Outputs September 1998 SCAN18373T Transparent Latch with TRI-STATE ®.

General Description

The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable control signals.

This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Key Features

  • n n n n n n n n n n IEEE 1149.1 (JTAG) Compliant Buffered active-low latch enable TRI-STATE outputs for bus-oriented.

SCAN18373T Distributor

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