| Part number | SCAN18373T |
|---|---|
| Datasheet | SCAN18373T_NationalSemiconductor.pdf |
| File Size | 170.88 KB |
| Manufacturer | National Semiconductor (now Texas Instruments) |
| Description | Transparent Latch |
|
|
The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable control signals. This device is pliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data...
See all National Semiconductor (now Texas Instruments) datasheets
| Part Number | Description |
|---|---|
| SCAN18374T | D Flip-Flop |
| SCAN182245A | Non-Inverting Transceiver |
| SCAN18245T | Non-Inverting Transceiver |
| SCAN18540T | Inverting Line Driver |
| SCAN18541T | Non-Inverting Line Driver |
| SCAN12100 | CPRI SerDes |
| SCAN16512 | Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver |
| SCAN16602 | Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver |
| SCAN25100 | CPRI SerDes |
| SCAN50C400 | 1.25/2.5/5.0 GBPS Quad Multi-rate Backplane Transceiver |
