SCAN18374T datasheet by National Semiconductor (now Texas Instruments).
| Part number | SCAN18374T |
|---|---|
| Datasheet | SCAN18374T_NationalSemiconductor.pdf |
| File Size | 162.99 KB |
| Manufacturer | National Semiconductor (now Texas Instruments) |
| Description | D Flip-Flop |
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The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals. This device is pliant with IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN Architecture with the incorporation of the defined BOUNDARY-SCAN test logic and test access port consisting of Test Data Input (TDI), Test Data Out...
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