SCAN18374T Datasheet | National Semiconductor

SCAN18374T D Flip-Flop with TRI-STATE Outputs September 1998 SCAN18374T D Flip-Flop with TRI-STATE ® Outputs General Description The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals. This device is pliant with IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN Architecture with the incorporation of the defined BOUNDARY-SCAN test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK). Features n n n n n n n n n n IEEE 1149.1 (JTAG) pliant Buffered positive edge-triggered clock TRI-STATE outputs for bus-oriented applications 9-bit data busses for parity applications Reduced-swing outputs source 24 m A/sink 48 m A (Mil) Guaranteed to drive 50Ω transmission line to TTL input levels of 0.8V and 2.0V TTL patible inputs 25 mil pitch Cerpack packaging Includes CLAMP and HIGHZ instructions Standard Microcircuit Drawing (SMD) 5962-9320701 Connection Diagram Pin Names AOE1, BOE1 AO(0- 8), BO(0- 8) Description TRI-STATE Output Enable Inputs TRI-STATE Outputs DS100322-1 Pin Names AI(0- 8), BI(0- 8) ACP, BCP TRI-STATE ® Description Data Inputs Clock Pulse Inputs is a registered trademark of National Semiconductor Corporation. © 1998 National Semiconductor Corporation DS100322 .national. Truth Tables Inputs ACP X N N AOE1 H L L Inputs BCP X N N H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance N = L-to-H Transition AO(0- 8) AI(0- 8) X L H Z L H BO(0- 8) BI(0- 8) X L H Z L H BOE1 H L L Functional Description The SCAN18374 consists of two sets of nine edge-triggered flip-flops with individual D-type inputs and TRI-STATE true outputs. The buffered clock and buffered Output Enable pins are mon to all flip-flops. Each set of the nine flip-flops will store the state of their individual D inputs that meet the setup and hold...