Datasheet Details
| Part number | SCAN18541T |
|---|---|
| Manufacturer | National Semiconductor (now Texas Instruments) |
| File Size | 151.68 KB |
| Description | Non-Inverting Line Driver |
| Datasheet | SCAN18541T_NationalSemiconductor.pdf |
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Overview: SCAN18541T Non-Inverting Line Driver with TRI-STATE Outputs September 1998 SCAN18541T Non-Inverting Line Driver with TRI-STATE ®.
| Part number | SCAN18541T |
|---|---|
| Manufacturer | National Semiconductor (now Texas Instruments) |
| File Size | 151.68 KB |
| Description | Non-Inverting Line Driver |
| Datasheet | SCAN18541T_NationalSemiconductor.pdf |
|
|
|
The SCAN18541T is a high speed, low-power line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented paired output enable control signals.
This device is pliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).
n n n n n n n n n Dual output enable signals per byte TRI-STATE outputs for bus-oriented applications 9-bit data busses for parity applications Reduced-swing outputs source 24 mA/sink 48 mA (Mil) Guaranteed to drive 50Ω transmission line to TTL input levels of 0.8V and 2.0V TTL patible inputs 25 mil pitch Cerpack packaging Includes CLAMP and HIGHZ instructions Standard Microcircuit Drawing (SMD) 5962-9311601
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