• Part: ADC12DJ3200
  • Description: RF-Sampling ADC
  • Manufacturer: Texas Instruments
  • Size: 2.88 MB
ADC12DJ3200 Datasheet (PDF) Download
Texas Instruments
ADC12DJ3200

Description

The ADC12DJ3200 device is an RF-sampling, gigasample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode.

Key Features

  • 1 ADC core: - 12-bit resolution - Up to 6.4 GSPS in single-channel mode - Up to 3.2 GSPS in dual-channel mode
  • Performance specifications: - Noise floor (no signal, VFS = 1.0 VPP-DIFF): - Dual-channel mode: -151.8 dBFS/Hz - Single-channel mode: -154.6 dBFS/Hz - HD2, HD3: -65 dBc up to 3 GHz
  • Buffered analog inputs with VCMI of 0 V: - Analog input bandwidth (-3 dB): 8.0 GHz - Usable input frequency range: >10 GHz - Full-scale input voltage (VFS, default): 0.8 VPP - Analog input common-mode (VICM): 0 V
  • Noiseless aperture delay (TAD) adjustment: - Precise sampling control: 19-fs step - Simplifies synchronization and interleaving - Temperature and voltage invariant delays
  • Easy-to-use synchronization features: - Automatic SYSREF timing calibration - Timestamp for sample marking
  • JESD204B serial data interface: - Supports subclass 0 and 1 - Maximum lane rate: 12.8 Gbps - Up to 16 lanes allows reduced lane rate
  • Digital down-converters in dual-channel mode: - Real output: DDC bypass or 2x decimation - Complex output: 4x, 8x, or 16x decimation - Four independent 32-Bit NCOs per DDC
  • Power consumption: 3 W
  • Power supplies: 1.1 V, 1.9 V