ADC12DJ3200QML-SP
ADC12DJ3200QML-SP is RF-Sampling Analog-to-Digital Converter manufactured by Texas Instruments.
Features
- ADC core:
- 12-Bit resolution
- Up to 6.4 GSPS in single-channel mode
- Up to 3.2 GSPS in dual-channel mode
- Noise floor (no signal, VFS = 1 VPP-DIFF):
- Dual-channel mode:
- 149.5 d BFS/Hz
- Single-channel mode:
- 152.4 d BFS/Hz
- Peak noise power ratio (NPR): 45.4 d B
- Buffered analog inputs with VCMI of 0 V:
- Analog input bandwidth (- 3 d B): 7 GHz
- Usable input frequency range: >10 GHz
- Full-scale input voltage (VFS, default): 0.8 VPP
- Noiseless aperture delay (t AD) adjustment:
- Precise sampling control: 19-fs step size
- Temperature and voltage invariant delays
- Easy-to-use synchronization features
- Automatic SYSREF timing calibration
- Timestamp for sample marking
- JESD204B subclass-1 pliant interface:
- Maximum lane rate: 12.8 Gbps
- Up to 16 lanes allows reduced lane rate
- Digital down-converters in dual-channel mode:
- Real output: DDC bypass or 2x decimation
- plex output: 4x, 8x, or 16x decimation
- Radiation performance:
- Total Ionizing Dose (TID): 300 krad (Si)
- Single Event Latchup (SEL): 120 Me V-cm2/mg
- Single Event Upset (SEU) immune registers
- Power consumption: 3 W
2 Applications
- Satellite munications (SAT)
- Phased array radar, SIGINT, and ELINT
- Synthetic Aperture Radar (SAR)
- Time-of-flight and LIDAR distance measurement
- RF Sampling Software-Defined Radio (SDR)
- Spectrometry
3...
