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SN54ABT8543 - SCAN TEST DEVICES

Description

The ’ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

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Datasheet Details

Part number SN54ABT8543
Manufacturer Texas Instruments
File Size 634.22 KB
Description SCAN TEST DEVICES
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SN54ABT8543, SN74ABT8543 SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS SCBS120E – AUGUST 1991 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F543 and ’ABT543 in the Normal-Function Mode D SCOPE ™ Instruction Set – IEEE Standard 1149.
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