Download IXFJ36N30 Datasheet PDF
IXFJ36N30 page 2
Page 2

IXFJ36N30 Key Features

  • International standard package
  • Low R HDMOS process
  • Rugged polysilicon gate cell structure
  • High mutating dv/dt rating
  • Fast switching times

IXFJ36N30 Description

+150 V V V V A A A mJ V/ns W °C °C.