• Part: ADC12DJ5200-SP
  • Description: RF-Sampling Analog-to-Digital Converter
  • Manufacturer: Texas Instruments
  • Size: 7.50 MB
Download ADC12DJ5200-SP Datasheet PDF
Texas Instruments
ADC12DJ5200-SP
Features - Radiation Tolerance: - Total Ionizing Dose (TID): 300 krad (Si) - Single Event Latchup (SEL): 120 Me V-cm2/mg - Single Event Upset (SEU) immune registers - ADC core: - 12-bit resolution - Up to 10.4 GSPS in single-channel mode - Up to 5.2 GSPS in dual-channel mode - Performance specifications: - Noise floor (- 20 d BFS, VFS = 1 VPP-DIFF): - Dual-channel mode: - 151.8 d BFS/Hz - Single-channel mode: - 154.4 d BFS/Hz - ENOB (dual channel, FIN = 2.4 GHz): 8.6 Bits - Buffered analog inputs with VCMI of 0 V: - Analog input bandwidth (- 3 d B): 8 GHz - Usable input frequency range: > 10 GHz - Full-scale input voltage (VFS, default): 0.8 VPP - Noiseless aperture delay (t AD) adjustment: - Precise sampling control: 19-fs Step - Simplifies synchronization and interleaving - Temperature and voltage invariant delays - Easy-to-use synchronization features : - Automatic SYSREF timing calibration - Time stamp for sample marking - JESD204C serial data interface: - Maximum lane rate: 17.16 Gbps -...