Datasheet Summary
SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
SCBS753
- FEBRUARY 2002
D Member of the Texas Instruments
Widebus Family
D UBT Transceiver bines D-Type
Latches and D-Type Flip-Flops for
Operation in Transparent, Latched, or
Clocked Mode
D patible With IEEE Std 1149.1-1990
(JTAG) Test Access Port (TAP) and
Boundary-Scan Architecture
D Includes D-Type Flip-Flops and Control
Circuitry to Provide Multiplexed
Transmission of Stored and Real-Time Data
D Two Boundary-Scan Cells (BSCs) Per I/O for Greater Flexibility
D SCOPE Instruction Set
- IEEE Std 1149.1-1990 Required Instructions, Optional INTEST, and P1149.1A CLAMP and HIGHZ
- Parallel Signature Analysis (PSA)...