SN74ABT18640 device equivalent, scan test device.
of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Wideb.
The ’ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of.
Image gallery
TAGS
Manufacturer
Related datasheet
Download (Size : 552.32KB)