SN74ABT18646 Datasheet | Texas Instruments

D Member of the Texas Instruments Widebus Family D patible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Two Boundary-Scan Cells Per I/O for Greater Flexibility SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS131A - AUGUST 1992 - REVISED JANUARY 2002 D SCOPE Instruction Set - IEEE Std 1149.1-1990 Required Instructions, Optional INTEST, and P1149.1A CLAMP and HIGHZ - Parallel Signature Analysis at Inputs With Masking Option - Pseudorandom Pattern Generation From Outputs - Sample Inputs/Toggle Outputs - Binary...