SN74LVT182512 Datasheet, DEVICES, Texas Instruments

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SN74LVT182512 Application

of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Wideb.

SN74LVT182512 Description

The ’LVT18512 and ’LVT182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitat.

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