* n n n n n n n n n n n n n Radiation Hardened up to 1 x 10 6 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditions Repetitive Avalanche Rating Dynamic dv/dt Rating
IRHNA7160 Datasheet (242.20 KB)
IRHNA7160
International Rectifier
242.20 KB
N-channel transistor.
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Provisional Data Sheet No. PD-9.1396
REPETITIVE AVALANCHE AND dv/dt RATED
HEXFET TRA.
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