Datasheet4U Logo Datasheet4U.com

SN74BCT8240A SCAN TESTER

SN74BCT8240A Description

SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E * FEBRUARY 1990 * REVISED DECEMBER 1996 D Members .
The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.

SN74BCT8240A Applications

* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE is a trademark of Texas Instruments Incorporated. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments sta

📥 Download Datasheet

Preview of SN74BCT8240A PDF
datasheet Preview Page 2 datasheet Preview Page 3

📁 Related Datasheet

  • SN74101 - AND-OR Gate (ETC)
  • SN74102 - AND Gate (ETC)
  • SN74103 - Dual J-K Flip-Flop (ETC)
  • SN74106 - Dual J-K Flip-Flop (ETC)
  • SN74108 - Dual J-K Flip Flop (ETC)
  • SN7411 - Triple 3-Input AND (ETC)
  • SN74120 - Dual Pulse Synchronizers / Drivers (Texas Instruments Inc)
  • SN74124 - Dual Voltage Controlled Oscillators (ETC)

📌 All Tags

SCAN TESTER Texas Instruments
Texas Instruments SN74BCT8240A-like datasheet