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SN74BCT8374A

SCAN TESTER

SN74BCT8374A General Description

The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan acces.

SN74BCT8374A Datasheet (501.91 KB)

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Datasheet Details

Part number:

SN74BCT8374A

Manufacturer:

Texas Instruments ↗

File Size:

501.91 KB

Description:

Scan tester.
SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E JUNE 1990 REVISED JULY 1996 D M.

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SN74BCT8374A SCAN TESTER Texas Instruments

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