SN74BCT8374A Datasheet - Texas Instruments

SN74BCT8374A SCAN TESTER

The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan acces.

SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E JUNE 1990 REVISED JULY 1996 D Members of the Texas Instruments SCOPE  Family of Testability Products D Octal Test-Integrated Circuits D Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchronous to Test Access Port (TAP) D Implement O.

SN74BCT8374A Datasheet (501.91 KB)