Datasheet4U Logo Datasheet4U.com

SN74BCT8373A

SCAN TESTER

SN74BCT8373A General Description

The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circu.

SN74BCT8373A Datasheet (488.69 KB)

Preview of SN74BCT8373A PDF

Datasheet Details

Part number:

SN74BCT8373A

Manufacturer:

Texas Instruments ↗

File Size:

488.69 KB

Description:

Scan tester.
SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F JUNE 1990 REVISED JULY 1996 D Members of the Texa.

📁 Related Datasheet

SN74BCT8374A SCAN TESTER (Texas Instruments)

SN74BCT8240A SCAN TESTER (Texas Instruments)

SN74BCT8244A SCAN TESTER (Texas Instruments)

SN74BCT8245A SCAN TESTER (Texas Instruments)

SN74BCT125A QUADRUPLE BUS BUFFER GATES (Texas Instruments)

SN74BCT125AN QUADRUPLE BUS BUFFER GATES (Texas Instruments)

SN74BCT126A QUADRUPLE BUS BUFFER GATES (Texas Instruments)

SN74BCT2240 OCTAL BUFFERS AND LINE/MOS DRIVERS (Texas Instruments)

SN74BCT2240N OCTAL BUFFERS AND LINE/MOS DRIVERS (Texas Instruments)

SN74BCT2244 OCTAL BUFFERS AND LINE/MOS DRIVERS (Texas Instruments)

TAGS

SN74BCT8373A SCAN TESTER Texas Instruments

Image Gallery

SN74BCT8373A Datasheet Preview Page 2 SN74BCT8373A Datasheet Preview Page 3

SN74BCT8373A Distributor