SN74BCT8373A Datasheet (Texas Instruments)

SN74BCT8373A, SCAN TESTER

The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE™ testability integratedcircuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies.

Scan access to the test circu

SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F JUNE 1990 REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Octal Test-Integrated Circuits D Functionally Equivalent to ’F373 and ’BCT373 in the Normal-Function Mode D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchronous to Test Access Port (TAP) D Implement Optional Test Reset