SN74BCT8244A Datasheet - Texas Instruments

SN74BCT8244A SCAN TESTER

The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry i.

SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E FEBRUARY 1990 REVISED JULY 1996 D Members of the Texas Instruments SCOPE™ Family of Testability Products D Octal Test-Integrated Circuits D Functionally Equivalent to ’F244 and ’BCT244 in the Normal-Function Mode D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Operation Synchronous to Test Access Port (TAP) D Implement Optional Test Reset Sig.

SN74BCT8244A Datasheet (452.03 KB)