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SN74BCT8244A SCAN TESTER

SN74BCT8244A Description

SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E * FEBRUARY 1990 * REVISED JULY 1996 D Members of the Texas I.
The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE™ testability integrated-circuit family.

SN74BCT8244A Applications

* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE is a trademark of Texas Instruments Incorporated. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments sta

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