KFG2816U1M-DIB Datasheet | Samsung Semiconductor

description 5. Added OTP erase case NOTE 6. Revised case definitions of Interrupt Status Register 7. Added a NOTE to mand register 8. Added ECClog Sector Information table 9. Removed ’data unit based data handling’ from description of Device Operation 10. Revised description on Warm/Hot/NAND Flash Core Reset 11. Revised Warm Reset Timing 12. Revised description for 4-, 8-, 16-, 32-Word Linear Burst Mode 13. Revised OTP operation description 14. Added note for OTPL in Internal Register Reset 15. Removed all block lock default case after cold or warm reset 16. Added explanation for each prohibited case in protect mode 17. Revised the case of writing other mands during Multi Block Erase routine 18. Added note for Erase Suspend/Resume 19. Added supplemental explanation for ECC Operation 20. Removed classification...