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BLF7G10LS-250 - Power LDMOS transistor

Download the BLF7G10LS-250 datasheet PDF. This datasheet also covers the BLF7G10L-250 variant, as both devices belong to the same power ldmos transistor family and are provided as variant models within a single manufacturer datasheet.

General Description

250 W LDMOS power transistor for base station applications at frequencies from 869 MHz to 960 MHz.

Table 1.

Typical performance Test signal: 3GPP; test model 1; 64 DPCH; PAR = 7.5 dB at 0.01 % probability on CCDF per carrier; carrier spacing = 5 MHz.

Key Features

  • Excellent ruggedness.
  • High efficiency.
  • Low thermal resistance providing excellent thermal stability.
  • Designed for broadband operation (869 MHz to 960 MHz).
  • Lower output capacitance for impro.

📥 Download Datasheet

Note: The manufacturer provides a single datasheet file (BLF7G10L-250-Ampleon.pdf) that lists specifications for multiple related part numbers.

Datasheet Details

Part number BLF7G10LS-250
Manufacturer Ampleon
File Size 403.59 KB
Description Power LDMOS transistor
Datasheet download datasheet BLF7G10LS-250 Datasheet

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

View original datasheet text
BLF7G10L-250; BLF7G10LS-250 Power LDMOS transistor Rev. 6 — 7 November 2016 Product data sheet 1. Product profile 1.1 General description 250 W LDMOS power transistor for base station applications at frequencies from 869 MHz to 960 MHz. Table 1. Typical performance Test signal: 3GPP; test model 1; 64 DPCH; PAR = 7.5 dB at 0.01 % probability on CCDF per carrier; carrier spacing = 5 MHz. Typical RF performance at Tcase = 25 C. Test signal f IDq VDS PL(AV) Gp D ACPR (MHz) (mA) (V) (W) (dB) (%) (dBc) 2-carrier W-CDMA 869 to 894 [1] 1800 30 60 19.5 27.4 35.6 2-carrier W-CDMA 920 to 960 [2] 1800 30 60 19.5 30.5 34 [1] In a common source class-AB application test circuit. [2] In a common source class-AB production test circuit. 1.