of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, UBT, .

The ’LVTH18504A and ’LVTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to fa.

SN74LVTH18502A

SN74LVTH18512

SN74LVTH182502A

SN74LVTH182504A

SN74LVTH182512

SN74LVTH182646A

SN74LVTH182652A

SN74LVTH18646A

SN74LVTH18652A

SN74LVTH125

SN74LVTH125-EP

SN74LVTH126

SN74LVTH162240

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