MRFG35002N6T1
MRFG35002N6T1 is Gallium Arsenide PHEMT RF Power Field Effect Transistor manufactured by Freescale Semiconductor.
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Freescale Semiconductor Technical Data
Document Number: MRFG35002N6 Rev. 1, 5/2006
Gallium Arsenide PHEMT
RF Power Field Effect Transistor
Designed for WLL/MMDS/BWA or UMTS driver applications. Characterized from 500 to 5000 MHz. Device is unmatched and is suitable for use in Class AB Customer Premise Equipment (CPE) applications.
- Typical Single
- Carrier W
- CDMA Performance: VDD = 6 Volts, IDQ = 65 m A, Pout = 158.5 m Watts Avg., 3550 MHz, Channel Bandwidth = 3.84 MHz, PAR = 8.5 d B @ 0.01% Probability on CCDF. Power Gain
- 10 d B Drain Efficiency
- 27% ACPR @ 5 MHz Offset
- - 41 d Bc in 3.84 MHz Channel Bandwidth
- 1.5 Watts P1d B @ 3550 MHz, CW
- Excellent Phase Linearity and Group Delay Characteristics
- High Gain, High Efficiency and High Linearity
- Ro HS pliant.
- In Tape and Reel. T1 Suffix = 1000 Units per 12 mm, 7 inch Reel.
3.5 GHz, 1.5 W, 6 V POWER FET Ga As PHEMT
CASE 466
- 03, STYLE 1 PLD
- 1.5 PLASTIC
Table 1. Maximum Ratings
Rating Drain- Source Voltage Gate- Source Voltage RF Input Power Storage Temperature Range Channel Temperature
(1)
Symbol VDSS VGS Pin Tstg Tch TC
Value 8 -5 22
- 65 to +150 175
- 20 to +85
Unit Vdc Vdc d Bm °C °C °C
Operating Case Temperature Range
Table 2. Thermal Characteristics
Characteristic Thermal Resistance, Junction to Case Symbol RθJC Value (2) 15.2 Unit °C/W
Table 3. Moisture Sensitivity Level
Test Methodology Per JESD 22
- A113, IPC/JEDEC J
- STD
- 020 Rating 1 Package Peak Temperature 260 Unit °C
1. For reliable operation, the operating channel temperature should not exceed 150°C. 2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://.freescale./rf. Select Documentation/Application Notes
- AN1955.
© Freescale Semiconductor, Inc., 2005. All rights...