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MSR2N2222AUBC - Rad Hard NPN Silicon Switching Transistor

This page provides the datasheet information for the MSR2N2222AUBC, a member of the MSR2N2222AUB Rad Hard NPN Silicon Switching Transistor family.

Description

This RHA level high speed switching NPN transistor, 2N2222A in a UB or UBC ceramic package, is ideal to drive many high-reliability applications.

This device is constructed and screened to a JANSR performance level with radiation test method 1019 wafer lot acceptance conducted on all die lots.

Features

  • JEDEC registered 2N2222A.
  • TID level screened per MIL-PRF-19500.
  • Also available with ELDRS testing to 0.01 Rad(s)/ sec.
  • MKCR/MHCR chip die available.
  • RHA (Radiation hardness assured) lot by lot validation testing via ELDR 0.1 Rad (SI)/sec dose rate Screened Levels: MSR UB & UBC Package Also available in: TO-206AA (TO-18) package (leaded top-hat) MSR2N2222A(L).

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Datasheet preview – MSR2N2222AUBC

Datasheet Details

Part number MSR2N2222AUBC
Manufacturer Microsemi
File Size 776.39 KB
Description Rad Hard NPN Silicon Switching Transistor
Datasheet download datasheet MSR2N2222AUBC Datasheet
Additional preview pages of the MSR2N2222AUBC datasheet.

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Full PDF Text Transcription

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MSR2N2222AUB / UBC Rad Hard NPN Silicon Switching Transistor Screened per MIL-PRF-19500 & ESCC 22900 Radiation Level TID ELDRS QPL RANGE and RAD LEVEL MSR2N2222AUB 100 Krad 100 Krad DESCRIPTION This RHA level high speed switching NPN transistor, 2N2222A in a UB or UBC ceramic package, is ideal to drive many high-reliability applications. This device is constructed and screened to a JANSR performance level with radiation test method 1019 wafer lot acceptance conducted on all die lots. Fully compliant to GSFC EEE-INST-002 reliability, screening and radiation hardness assurance requirements for space flight projects Important: For the latest information, visit our website http://www.microsemi.com.
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