MSR2N2907A Description
This RHA level PNP switching transistor, 2N2907A device in a TO-206AA package, is ideal to drive many high-reliability applications. This device is constructed and screened to a JANSR performance level with radiation test method 1019 wafer lot acceptance conducted on all die lots. Fully pliant to GSFC EEE-INST-002 reliability, screening and radiation hardness assurance requirements for space flight projects...
MSR2N2907A Key Features
- JEDEC registered 2N2907A
- TID level screened per MIL-PRF-19500
- Also available with ELDRS testing to 0.01 Rad(s)/ sec
- MKCR/MHCR chip die available
- RHA (Radiation hardness assured) lot by lot validation testing via ELDR 0.1 Rad (SI)/sec dose rate