* n n n n n n n n n n n n Radiation Hardened up to 1 x 105 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditions Repetitive Avalanche Rating Dynamic dv/dt Rating Simp
IRHN9230 Datasheet (222.17 KB)
IRHN9230
International Rectifier
222.17 KB
P-channel transistor .
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Provisional Data Sheet No. PD-9.1445
REPETITIVE AVALANCHE AND dv/dt RATED
HEXFET® TR.
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