SCAN18374T Datasheet - National Semiconductor

SCAN18374T D Flip-Flop

The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN Architecture with the incorpor.

SCAN18374T Features

* n n n n n n n n n n IEEE 1149.1 (JTAG) Compliant Buffered positive edge-triggered clock TRI-STATE outputs for bus-oriented applications 9-bit data busses for parity applications Reduced-swing outputs source 24 mA/sink 48 mA (Mil) Guaranteed to drive 50Ω transmission line to TTL input levels of 0.8V

SCAN18374T_NationalSemiconductor.pdf